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http://repositoriodigital.ipn.mx/handle/123456789/11620
Título : | Characterization of semiconductors using photoacoustics |
Palabras clave : | SEMICONDUCTORS PHOTOACOUSTIC |
Fecha de publicación : | 16-ene-2013 |
Editorial : | Thermal Wave Physics and Related Photothermal Techniques: Basic Principles and Recent Developments, TRANSWORLD RESEARCH |
Descripción : | Since the early seventies, photoacoustic has been
emerged as a well suited technique for the measurement of optical
and transport properties of semiconductors, showing in many cases
considerable advantages respecting other characterization methods.
As these materials are often grown in the form of thin films on
different kind of substrates, in this chapter we shall describe some
of the theoretical models devised in the last years to the
measurement of their electronic transport properties. We will also
show how photoacoustic spectroscopy allows the measurement of
the wavelength dependence of the optical absorption coefficient of
very opaque semiconductor thin layers. INSTITUTO POLITECNICO NACIONAL, CONACYT |
URI : | http://www.repositoriodigital.ipn.mx/handle/123456789/11620 |
Otros identificadores : | 978-81-7895-401-1 http://hdl.handle.net/123456789/1152 |
Aparece en las colecciones: | Doctorado |
Ficheros en este ítem:
Fichero | Descripción | Tamaño | Formato | |
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Marin_Cap_6_2010.pdf | 313.81 kB | Adobe PDF | Visualizar/Abrir |
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